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Patent
Publication NumberUS 20200013606Filing StatusPatent ApplicationAvailabilityUnknownFiling Date2019-09-16Publication Date2020-01-09
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
Patent
Publication NumberEP 2580773 B1Filing StatusIssued PatentAvailabilityUnknownFiling Date2011-06-08Publication Date2019-12-25
Patent
Publication NumberUS 10446383Filing StatusIssued PatentAvailabilityUnknownFiling Date2017-04-11Publication Date2019-10-15
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
Patent
Publication NumberEP 2389681 B1Filing StatusIssued PatentAvailabilityUnknownFiling Date2010-01-23Publication Date2019-08-21
Research Grant
IDDE-SC0019599Funding AgencyDepartment of EnergyEffective Date2019-02-19Expiration Date2019-11-18Funding Amount$224,947
Imaging of molecular components of plant tissue (roots, leaves, seeds etc.) by microfocused laser desorption is maturing into a useful tool for describing plant molecular biology. Due to pioneering work in DOE laboratories and elsewhere the detection sensitivity of laser desorbed molecules is increased by the addition microscale sized colloidal metals (e.g. Sliver) or graphite to aid as a “matrix” in the laser desorption/ionization process. (The colloidal microparticle “matrix” evaporates aft…
Research Grant
IDDE-SC0018450Funding AgencyDepartment of EnergyEffective Date2018-04-09Expiration Date2019-01-08Funding Amount$224,882
Mass spectrometric measurement of elemental isotopic ratios from solids has been mostly obtained by secondary ion mass spectrometry (SIMS) which has a sensitivity for almost all elements superior to Xray fluorescence and laser desorption ICPMS- In SIMS elemental and molecular ions are liberated from the near surface of a solid by energetic micron or submicron focused ion beams and extracted with an electric field into a mass spectrometer (often a time of flight mass spectrometer)- Two problem…
Patent
Publication NumberEP 1677897 B1Filing StatusIssued PatentAvailabilityUnknownFiling Date2004-10-19Publication Date2016-10-12
Patent
Publication NumberUS 20160189942Filing StatusPatent ApplicationAvailabilityUnknownFiling Date2016-03-04Publication Date2016-06-30
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
Patent
Publication NumberUS 9297761Filing StatusIssued PatentAvailabilityUnknownFiling Date2013-11-27Publication Date2016-03-29
Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
We found 158 documents that match your Search
Research Grants: 69
Patents: 89

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